Editorial Board
Abstract
Prof.dr.ir. C.G. (Caspar) Chorus
c.g.chorus@tudelft.nl
Editor-In-Chief
Delft University of Technology, The Netherlands
Dr. O. (Oded) Cats
o.cats@tudelft.nl
Associate Editor
Delft University of Technology, The Netherlands
Prof.dr. B. van Wee
g.p.vanwee@tudelft.nl
Delft University of Technology, The Netherlands
Prof.dr.ir. V.A.W.J. Marchau
v.marchau@fm.ru.nl
Radboud University Nijmegen, The Netherlands
Prof.dr.ir. S. Hoogendoorn
s.p.hoogendoorn@tudelft.nl
Delft University of Technology, The Netherlands
Dr. D. Stead
d.stead@tudelft.nl
Delft University of Technology, The Netherlands
Prof.dr.ir. L. Tavasszy
l.a.tavassszy@tudelft.nl
Delft University of Technology, The Netherlands
Prof.dr.ir. R.E.C.M. Van der Heijden
r.vanderheijden@fm.ru.nl
Radboud University Nijmegen, The Netherlands
Prof.dr. E. Van de Voorde
eddy.vandevoorde@uantwerpen.be
University of Antwerp, Belgium
Prof.dr. F. Witlox
frank.witlox@ugent.be
Ghent University, Belgium
Advisory Board Peter Nijkamp (Chairman)VU University, The Netherlands
Kay Axhausen
ETH Zurich, Switzerland
David Banister
University College London, UK
Michel Beuthe
Facultés Universitaires Catholiques de Mons, Belgium
Michel Bierlaire
EPFL Lausanne, Switzerland
Piet Bovy
Delft University of Technology, The Netherlands
Oliver Carsten
Leeds, University, UK
David Hensher
University of Sydney, Australia
Veli Himanen
Technical Research Centre of Finland (FIN), Finland
Martin Lanzendorf
Goethe Universität Frankfurt, Germany
Rico Maggi
University of Zürich, Switzerland
Patricia Mokhtarian
UC Davis, USA
Tae Oum
University of British Columbia, Canada
Robert E. Paaswell
City University of New York, USA
Aura Regiani
University of Bologna, Italy
Piet Rietveld (†)
VU University, The Netherlands
Daniel Shefer
Technion-Israel Institure of Technology, Israel
Jos van Ommeren
VU University, The Netherlands
Erik Verhoef
VU University, The Netherlands
Joan Walker
UC Berkeley, USA
